SIMS surface spectroscopy analysis is a photograph by Science Photo Library which was uploaded on March 4th, 2014.
SIMS surface spectroscopy analysis
SIMS surface spectroscopy analysis. Researcher using a secondary ion mass spectrometer (SIMS) to carry out surface analysis of various samples. This... more
Title
SIMS surface spectroscopy analysis
Artist
Science Photo Library
Medium
Photograph
Description
SIMS surface spectroscopy analysis. Researcher using a secondary ion mass spectrometer (SIMS) to carry out surface analysis of various samples. This device is used to study solid-state surfaces and interfaces, including analyses of polymers, biological specimens, metals, and other materials. This Cameca IMS 5f dynamic SIMS is used to determine the depth distribution of elements in a material. It can identify materials from the lightest of elements up to those of 250 atomic mass units (amu). Photographed at the Solar Energy Research Facility (SERF) at the National Renewable Energy Laboratory (NREL), Golden, Colorado, USA.
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March 4th, 2014
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